Scanning Nearfield Infrared Microscopy.

Gillman, E.

Technical Information Center Oak Ridge Tennessee

关键词: Free electron lasers;    Infrared radiation;    Diffraction;    Microscopes;    Microscopy;   

RP-ID  :  DE2001781121

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Commonly, location specific chemical identification by means of vibrational spectroscopy in the infrared region is largely restricted to samples of macroscopic dimensions, on the order of one to several microns; the scale of the examined area is completely determined by the diffraction limit of the incident radiation. However, chemical identification at length scales less than the diffraction limit is possible using a scanned probe technique, the Scanning Near-Field Infrared Microscope (SNFIM). Using a scanned probe technique in the near-field, resolution of chemical features on the order of h/20 or (approximately) 100 nm can be achieved. An overview of previous experimental results using a free electron laser (FEL) and more conventional infrared sources will be discussed. Recent results from the SNFIM experiment at Jefferson Lab will also be presented.