WRCIP Environmental Test Shoot-Out, PEMS vs. CHP Surface Mount Transistors

SWEET, JAMES N. ; WAVRIK, RICHARD W. ; HWANG, STEPHEN C. ; VIGIL, DANIEL DONACIANO ; CURTIS, LORRAINE S. ; MARTINEZ, JIMMIE T. ; MARCHIONDO JR., JULIO P. ; PLUNKETT, PAUL V. ; MONTANO, MATTHEW A.

Sandia National Laboratories

关键词: 42 Engineering;    Comparative Evaluations;    Transistors;    Design;    Performance Testing;   

DOI  :  10.2172/807058
RP-ID  :  SAND2002-3724
RP-ID  :  AC04-94AL85000
RP-ID  :  807058

美国|英语

来源: UNT Digital Library

【 摘 要 】

No abstract prepared.