Innovative Characterization of Amorphous and Thin-Film Silicon for Improved Module Performance: 1 February 2005 - 31 July 2008

Taylor, P. C. ; Williams, G. A.

关键词: DEFECTS;    ELECTRON SPIN RESONANCE;    NUCLEAR MAGNETIC RESONANCE;    PERFORMANCE;    SILICON PV;    AMORPHOUS;    THIN FILM;    SILICON;    MODULE PERFORMANCE;    INNOVATIVE CHARACTERIZATION;    ELECTRONIC SPIN RESONANCE;    NUCLEAR MAGNETIC;    SATEBLER-WRONSKI EFFECT;    Solar Energy - Photovoltaics;   

DOI  :  10.2172/965120
RP-ID  :  NREL/SR-520-46649
PID  :  OSTI ID: 965120
Others  :  Other: XXL-5-44205-09
Others  :  TRN: US0903813

美国|英语

来源: SciTech Connect

【 摘 要 】

Electron spin resonance and nuclear magnetic resonance was done on amorphous silicon samples (modules with a-Si:H and a-SixGe1-x:H intrinsic layer) to study defects that contribute to Staebler-Wronski effect.