Structure and Dynamics of Domains in Ferroelectric Nanostructures. In-situ TEM Studies

Pan, Xiaoqing¹ 

[1] Univ. of Michigan, Ann Arbor, MI (United States)

关键词: Electron microscopy;    ferroelectrics;    domains;    in situ TEM;   

DOI  :  10.2172/1187994
RP-ID  :  DOE-UMICH--ER46416
PID  :  OSTI ID: 1187994

学科分类：材料科学（综合）

美国|英语

来源: SciTech Connect

【 摘 要 】

The goal of this project was to explore the structure and dynamic behaviors of ferroelectric domains in ferroelectric thin films and nanostructures by advanced transmission electron microscopy (TEM) techniques in close collaboration with phase field modeling. The experimental techniques used include aberration-corrected sub-?? resolution TEM and in-situ TEM using a novel scanning tunneling microscopy (STM) - TEM holder that allows the direct observation of nucleation and dynamic evolution of ferroelectric domains under applied electric field. Specifically, this project was aimed to (1) to study the roles of static electrical boundary conditions and electrical charge in controlling the equilibrium domain structures of BiFeO₃ thin films with controlled substrate constraints, (2) to explore the fundamental mechanisms of ferroelectric domain nucleation, growth, and switching under an applied electric field in both uniform thin films and nanostructures, and to understand the roles of crystal defects such as dislocations and interfaces in these processes, (3) to understand the physics of ferroelectric domain walls and the influence of defects on the electrical switching of ferroelectric domains.