Cross-plane thermal conductivity of highly oriented nanocrystalline bismuth antimony telluride thin films

JOURNAL OF ALLOYS AND COMPOUNDS

卷:490

Article

Takashiri, Masayuki¹  Tanaka, Saburo²  Miyazaki, Koji³  Tsukamoto, Hiroshi² 

[1] Komatsu Ltd, Div Res, Kanagawa 2548567, Japan

[2] Kyushu Inst Technol, Dept Biol Funct & Engn, Wakamatsu Ku, Kitakyushu, Fukuoka 8080196, Japan

[3] Kyushu Inst Technol, Dept Mech Engn, Tobata Ku, Kitakyushu, Fukuoka 8048550, Japan

关键词: Thermoelectric;    Thin film;    Thermal conductivity;   

DOI  :  10.1016/j.jallcom.2009.10.117

来源: Elsevier

【 摘 要 】

The cross-plane thermal conductivity of highly oriented nanocrystalline bismuth antimony telluride thin films is investigated. The thin film was deposited by a flash evaporation method. The resulting film was oriented with the c-axis to the substrate, and was composed of fine grains with an average grain size of 150 nm. The cross-plane thermal conductivity of the film was measured by a 3 omega method at room temperature, and was determined to be 0.6 W m(-1) K(-1). Compared to the single crystal bulk alloy of nearly the same composition and carrier concentration, the thin film exhibited a 20% reduction in the thermal conductivity. (c) 2009 Elsevier B.V. All rights reserved.

【 授权许可】

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