Mechanical response of UO2 single crystals submitted to low-energy ion irradiation

JOURNAL OF NUCLEAR MATERIALS

卷:467

Article

Tien-Hien Nguyen^1,2  Debelle, Aurelien¹  Boulle, Alexandre³  Garrido, Frederico¹  Thome, Lionel¹  Demange, Erie⁴ 

[1] Univ Paris 11, Univ Paris Saclay, CNRS IN2P3, CSNSM, F-91405 Orsay, France

[2] Vietnam Natl Univ Agr, Dept Phys, Hanoi, Vietnam

[3] CNRS, Ctr Europeen Ceram, Sci Proc Ceram & Traitements Surface, UMR 7315, F-87068 Limoges, France

[4] CNRS, Inst Sci Chim Rennes, UMR 6226, F-35042 Rennes, France

关键词: XRD;    UO2;    Radiation effects;    Elastic strain;    Defects;   

DOI  :  10.1016/j.jnucmat.2015.10.046

来源: Elsevier

【 摘 要 】

{111}- and {100}-oriented UO2 single crystals were irradiated with 500-keV Ce3+ ions in the 10(14)-9 x 10(14) cm(-2) fluence range. The irradiation-induced strain was monitored using high-resolution X-ray diffraction. A mechanical modelling dedicated to thin irradiated layers was applied to account for the reaction of the unirradiated part of the crystals. The elastic strain, which is confined along the surface normal of the samples, increases with ion fluence until it is dramatically relieved. This behaviour is observed for both orientations. While the measured elastic strain depends on the crystallographic direction, the strain due to irradiation defects only is found to be equal for both directions, with a maximum value of similar to 0.5%. Strain relaxation takes place at the damage peak, but the in-plane lattice parameter of the irradiated layer remains unchanged and equal to that of the pristine material. Meanwhile, the strain at the damaged/pristine interface continues to increase. (C) 2015 Elsevier B.V. All rights reserved.

【 授权许可】

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