Atomic scale characterization of deformation-induced interfacial mixing in a Cu/V nanocomposite wire

SCRIPTA MATERIALIA

卷:61

Article

Sauvage, X.¹  Genevois, C.¹  Da Costa, G.¹  Pantsyrny, V.² 

[1] Univ Rouen, Grp Phys Mat, CNRS, UMR 6634, F-76801 St Etienne, France

[2] VNIINM, Bochvar Inst Inorgan Mat, Moscow 123060, Russia

关键词: Copper;    Nanocomposite;    HAADF STEM;    Atom probe tomography;    Intermixing;   

DOI  :  10.1016/j.scriptamat.2009.06.007

来源: Elsevier

【 摘 要 】

The microstructure of a Cu/V nanocomposite wire processed by cold drawing was investigated by high-resolution transmission electron microscopy and atom probe tomography. The experimental data clearly reveal some deformation-induced interfacial mixing where the vanadium filaments are nanoscaled. The mixed layer is a 2 nm wide vanadium gradient in the face-centered cubic (fcc) Cu phase. This mechanical mixing leads to the local fragmentation and dissolution of the filaments and to the formation of vanadium supersaturated solid solutions in fcc Cu. (c) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

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