Atom probe tomography of a commercial light emitting diode

18th Microscopy of Semiconducting Materials Conference

物理学;材料科学

Larson, D.J.^1 ; Prosa, T.J.^1 ; Olson, D.^1 ; Lefebvre, W.^2 ; Lawrence, D.^1 ; Clifton, P.H.^1 ; Kelly, T.F.^1

CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WI 53711, United States^1

GPM UMR CNRS 6634, Université de Rouen, Saint Etienne du Rouvray 76801, France^2

关键词: Atom probe tomography;    Atomic-scale analysis;    Local electrodes;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/471/1/012030/pdf
DOI  :  10.1088/1742-6596/471/1/012030

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

The atomic-scale analysis of a commercial light emitting diode device purchased at retail is demonstrated using a local electrode atom probe. Some of the features are correlated with transmission electron microscopy imaging. Subtle details of the structure that are revealed have potential significance for the design and performance of this device.