Modelling of field emitter surface structure

2nd International School and Conference Saint-Petersburg OPEN on Optoelectronics, Photonics, Engineering and Nanostructures

Nikiforov, K.A.^1 ; Egorov, N.V.^1 ; Lunkovskiy, M.N.^1

Saint-Petersburg State University, 7-9, Universitetskaya nab., St. Petersburg

199034, Russia^1

关键词: Atom probe tomography;    Atomic packing density;    Field electron microscopy;    Multi-scale Modeling;    Radius of curvature;    Strong electric fields;    Topical application;    Transport function;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/643/1/012010/pdf
DOI  :  10.1088/1742-6596/643/1/012010

来源: IOP

【 摘 要 】

The paper presents a mathematical model of the crystal structure of the emitter, which is the subject of research in atom probe tomography and in the field electron microscopy. Electronic, mechanical and other properties of the sample having the shape of the tip with a radius of curvature at the top of the order of hundred nanometers, these methods are considered on the basis of field desorption and emission (electron or ion). Strong electric field simultaneously performs generating, focusing, accelerating and transport function. Therefore, multi-scale modeling of the properties of the sample, including an approximation of its shape on the micro-, meso- and nanolevel, calculation of atomic packing density and size of crystal faces is a topical applications and is used to interpret the results of field emission experiment.