RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography

IEEE Radio and Antenna Days of the Indian Ocean 2015

无线电电子学

Zhao, L.^1 ; Delamare, A.^1 ; Normand, A.^1 ; Delaroche, F.^1 ; Latry, O.^1 ; Vurpillot, F.^1 ; Ravelo, B.^2

UMR CNRS 6634 - Normandy University GPM, Université and INSA de Rouen, Saint-Etienne-du-Rouvray, France^1

IRSEEM EA 4353, Graduate School of Engineering, ESIGELEC, Saint-Etienne-du-Rouvray, France^2

关键词: Atom probe tomography;    Cryogenic chamber;    Interconnect lines;    Optical-controlled;    Rectangular shapes;    S-Parameter measurements;    Signal Integrity;    System frequency;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/120/1/012006/pdf
DOI  :  10.1088/1757-899X/120/1/012006

来源: IOP

【 摘 要 】

A signal integrity (SI) analysis of high voltage rectangular short pulses for the atom- probe system is explored in this paper. The operated RF transient pulse is considered for exciting on material sample inside an ultra-high vacuum (UHV) cryogenic chamber. The ns- duration pulse signal is injected into the cryogenic analysis chamber through the transmitting system mainly constituted by a microstrip interconnect line ended by optical controlled nonlinear load. The whole system frequency characterization is performed based on the S- parameter measurements. As expected, a challenging ultra-short rectangular shape pulse is exhibited by the pulser. Promising experimental results with the improvement of ion mass spectrum is demonstrated with the designed RF pulser.