Identification of nanometer-scale compositional fluctuations in silicate glass using electron microscopy and spectroscopy

SCRIPTA MATERIALIA

卷:154

Article

Nakazawa, Katsuaki¹  Miyata, Tomohiro^1,3  Amma, Shin-ichi²  Mizoguchi, Teruyasu¹ 

[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan

[2] Asahi Glass Co Ltd, New Prod R&D Ctr, Kanagawa Ku, 1150 Hazawa Cho, Yokohama, Kanagawa 2218755, Japan

[3] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Aoba Ku, Sendai, Miyagi 9808577, Japan

关键词: Silica glass;    Electron microscopy;    Phase separation;    Spinodal-type;   

DOI  :  10.1016/j.scriptamat.2018.05.048

来源: Elsevier

【 摘 要 】

Silicate glasses are indispensable for optical and photonics applications, and their properties are affected by phase-separated structures. Understanding the phase separation behavior inside the glasses is thus crucial for controlling their optical properties. Here, we attempt to identify the phase-separated structure inside silicate glass by high-angular annular dark field-scanning transmission electron microscopy (HAADF-STEM) combined with a multi-slice image simulation. In addition to the phase-separated structure, we also demonstrate that the identifications of the type and stage of the phase-separation are possible by the HAADF observation in combination with a phase separation simulation. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

Free