A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

SCRIPTA MATERIALIA

卷:143

Article

Kou, Jiawei¹  Chen, Kai¹  Tamura, Nobumichi² 

[1] Xi An Jiao Tong Univ, Ctr Adv Mat Performance Nanoscale CAMP Nano, State Key Lab Mech Behav Mat, Xian 710049, Shaanxi, Peoples R China

[2] Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA

关键词: Polychromatic X-ray Laue microdiffraction;    Orientation mapping;    Phase distribution;    Plastic deformation;   

DOI  :  10.1016/j.scriptamat.2017.09.005

来源: Elsevier

【 摘 要 】

Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

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