Experimental observations of twin formation during thermal annealing of nanocrystalline copper films using orientation mapping

SCRIPTA MATERIALIA

卷:141

Article

Rottmann, Paul F.¹  Hemker, Kevin J.^1,2 

[1] Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA

[2] Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA

关键词: Nanocrystalline materials;    Annealing twin;    Grain growth;    Thin films;    Orientation mapping;   

DOI  :  10.1016/j.scriptamat.2017.07.029

来源: Elsevier

【 摘 要 】

This study employed a TEM-based automated crystal orientation mapping technique that enables orientation mapping with nanoscale spatial resolution. This nanoscale orientation mapping technique was employed to study thermally-assisted grain growth and to quantify the attendant formation of nanotwins and twin junctions in nanocrystalline Cu. The grain size increased from 29 +/- 14 nm to 57 +/- 22 nm and the fraction of twin-containing grains increased from 0.18 to 0.70. Close inspection of the twins and twin junctions captured within orientation maps documented a frequency of junctions that was remarkably consistent with previous molecular dynamics predictions. 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

Free