Total IBA - Where are we?

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:271

Article

Jeynes, C.¹  Bailey, M. J.¹  Bright, N. J.¹  Christopher, M. E.¹  Grime, G. W.¹  Jones, B. N.¹  Palitsin, V. V.¹  Webb, R. P.¹ 

[1] Univ Surrey, Ion Beam Ctr, Guildford GU2 5XH, Surrey, England

关键词: Ion beam analysis;    Rutherford backscattering;    Particle induced X-ray analysis;    Thin films;    Elemental depth profiling;    Mapping;    Trace elements;    High sensitivity;    Accurate analysis;    Uncertainty budget;    Blind samples;    Certified reference materials;    Forensics;    SIMS standards;   

DOI  :  10.1016/j.nimb.2011.09.020

来源: Elsevier

【 摘 要 】

The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. These can potentially yield almost everything there is to know about the 3-D elemental composition of types of samples that have always been hard to analyse, given the sensitivity and the spacial resolution of the techniques used. Molecular and chemical information is available in principle with, respectively, MeV-SIMS and high resolution PIXE. However, these techniques separately give only partial information - the secret of Total IBA is to find synergies between techniques used simultaneously which efficiently give extra information. We here review how far Total IBA can be considered already a reality, and what further needs to be done to realise its full potential. (C) 2011 Published by Elsevier B.V.

【 授权许可】

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