Characterisation of gunshot residue particles using self-consistent ion beam analysis

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:267

Article; Proceedings Paper

Bailey, M. J.¹  Jeynes, C.¹ 

[1] Univ Surrey, Ion Beam Ctr, Guildford GU2 7XH, Surrey, England

关键词: PIXE;    RBS;    EBS;    Gunshot residue;    Simulated annealing;   

DOI  :  10.1016/j.nimb.2009.03.031

来源: Elsevier

【 摘 要 】

Individual particles of gunshot residue were studied with particle-induced X-ray emission and backscattering spectrometry using a 2.5 MeV H+ beam focussed to similar to 4 mu m and self-consistent fitting of the data. The geometry of these spherical particles was considered in order to accurately fit the corresponding particle spectrum and therefore to quantify the trace element composition of these particles. The demonstrable self-consistency of this method allows the compositions of most residue particles to be determined unambiguously and with a higher sensitivity to trace elements than conventional methods. (c) 2009 Elsevier B.V. All rights reserved.

【 授权许可】

Free