Characterization of W-type hexaferrite thin films prepared by chemical solution deposition

THIN SOLID FILMS

卷:726

Article

Soroka, Miroslav^1,2  Bursik, Josef¹  Kuzel, Radomir³  Prokleska, Jan³  Aguirre, Myriam H.^4,5 

[1] Czech Acad Sci, Vvi, Inst Inorgan Chem, Husinec Rez 25068 1001, Czech Republic

[2] Charles Univ Prague, Fac Sci, Hlavova 2030-8, Prague 12843 2, Czech Republic

[3] Charles Univ Prague, Fac Math & Phys, Ke Karlovu 5, Prague 12116 2, Czech Republic

[4] Univ Zaragoza, Inst Mat Sci Aragon, Dept Phys Condensed Matter, CSIC, Pedro Cerbuna 12, Zaragoza 50009, Spain

[5] Inst Nanosci Aragon, Lab Adv Microscopy, Ed I D,Campus Rio Ebro, Zaragoza 50018, Spain

关键词: W-type hexaferrites;    Thin films;    Chemical solution deposition;    Spin reorientation transition;   

DOI  :  10.1016/j.tsf.2021.138670

来源: Elsevier

【 摘 要 】

Thin films of W-type hexaferrite were grown on SrTiO3(111) single crystals using the chemical solution deposition method and metalorganic precursor solutions prepared using the modified Pechini method. The synthesis of single-phase materials required optimizing the initial stoichiometry and crystallization conditions. The results showed that a concurrent excess of alkaline earth metal and deficiency in divalent metal ion (Zn2+, Co2+) favors the synthesis of pure W hexaferrites. This off-stoichiometry suppressed the formation of an exceedingly stable spinel phase at pyrolysis temperatures. The epitaxial nature of thin films, expressed as the orientation relation (00l)W [[ (111)SrTiO3 and [110]W [[ [112]SrTiO3 and hence the pronounced anisotropy of their magnetic properties as well were established by three dimensional x-ray diffraction texture analysis and magnetization measurements, respectively and enabled to identify the temperature interval in which the characteristic spin reorientation transition occurs for a specific degree of cobalt substitution.

【 授权许可】

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