Tailoring the longitudinal electric fields of high-order laser beams and their direct verification in three dimensions

OPTICS COMMUNICATIONS

卷:459

Article

Kallioniemi, Leevi¹  Turquet, Leo¹  Lipsanen, Harri²  Kauranen, Martti¹  Bautista, Godofredo¹ 

[1] Tampere Univ, Photon Lab, POB 692, FI-33014 Tampere, Finland

[2] Aalto Univ, Dept Elect & Nanoengn, POB 13500, FI-00076 Aalto, Finland

关键词: Second-harmonic generation;    3D microscopy;    Semiconductor nanowire;    Polarization;    Longitudinal electric field;   

DOI  :  10.1016/j.optcom.2019.124894

来源: Elsevier

【 摘 要 】

We demonstrate the tailoring of longitudinal electric fields that arise from tight focusing of spatially phase-shaped high-order laser beams, and verify their spatial distribution in three dimensions. To tailor the three-dimensional (3D) spatial distribution of longitudinal electric fields, we precisely control the relative phase delay between the two lobes of a HG(10) laser beam using a spatial light modulator (SLM) before tight focusing. To verify the longitudinal electric fields in the focal volume, we employ 3D microscopic mapping of second-harmonic generation (SHG) from a single semiconductor nanowire that is extremely sensitive to the orientation of the longitudinal electric field. The technique is direct, general and expected to be useful in harnessing and in probing longitudinal electric fields with arbitrary spatial intensity distributions in the 3D focal volume.

【 授权许可】

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