Memory Operation of Z²-FET Without Selector at High Temperature

IEEE Journal of the Electron Devices Society

C. Navarro¹  F. Gamiz¹  J. Ahn²  S. Kwon²  Y.-T. Kim²  S. Cristoloveanu³ 

[1] Department of Electronics, University of Granada, Granada, Spain;Division of Materials Science and Engineering, Hanyang University, Seoul, South Korea;IMEP-LAHC, Grenoble INP MINATEC, Grenoble, France;

关键词: Matrix memory operation;    high temperature;    Z²-FET;    1T-DRAM;   

DOI  :  10.1109/JEDS.2021.3094104

来源: DOAJ

【 摘 要 】

The electrical performance of Z²-FET and memory operations of matrix are demonstrated at high temperatures up to 125 °C. The sharp subthreshold slope is maintained and the reliable operation is ensured within the memory window of 229 mV even though the turn on voltage of ‘0’- and ‘1’-states are shifted to lower voltage. The ‘0’-state current remains low while the ‘1’-state current gradually increases as the temperature increases leading to higher current margin. At the elevated temperature, the potential barriers are slightly reduced but does not collapse, which leads to the successful memory operation. However, increasing the temperature over 125 °C, the potential barrier at the ‘0’-state is significantly reduced and causes the failure of memory operation with high ‘0’-state current. The matrix demonstrates reliable memory operations without using selector circuits even at 125 °C.

【 授权许可】

Unknown