Determining Conversion Gain and Read Noise Using a Photon-Counting Histogram Method for Deep Sub-Electron Read Noise Image Sensors

IEEE Journal of the Electron Devices Society

Eric R. Fossum¹  Dakota A. Starkey¹ 

[1] Thayer School of Engineering at Dartmouth, Hanover, NH, USA;

关键词: CMOS Image Sensor;    Photon Counting;    Low Read Noise;    Conversion Gain;    VPR,;    VPM;   

DOI  :  10.1109/JEDS.2016.2536719

来源: DOAJ

【 摘 要 】

A new method for characterizing deep sub-electron read noise image sensors is reported. This method, based on the photon-counting histogram, can provide easy, independent and simultaneous measurements of the quanta exposure, conversion gain, and read noise. This new method provides a more accurate measure of conversion gain and read noise over conventional characterization techniques for image sensors with read noise from 0.15-0.40e- rms.

【 授权许可】

Unknown