期刊论文详细信息
IEEE Journal of the Electron Devices Society | |
Determining Conversion Gain and Read Noise Using a Photon-Counting Histogram Method for Deep Sub-Electron Read Noise Image Sensors | |
Eric R. Fossum1  Dakota A. Starkey1  | |
[1] Thayer School of Engineering at Dartmouth, Hanover, NH, USA; | |
关键词: CMOS Image Sensor; Photon Counting; Low Read Noise; Conversion Gain; VPR,; VPM; | |
DOI : 10.1109/JEDS.2016.2536719 | |
来源: DOAJ |
【 摘 要 】
A new method for characterizing deep sub-electron read noise image sensors is reported. This method, based on the photon-counting histogram, can provide easy, independent and simultaneous measurements of the quanta exposure, conversion gain, and read noise. This new method provides a more accurate measure of conversion gain and read noise over conventional characterization techniques for image sensors with read noise from 0.15-0.40e- rms.
【 授权许可】
Unknown