Deposition of CdZnTe Films with CSS Method on Different Substrates for Nuclear Radiation Detector Applications

Crystals

Yucheng Jiang¹  Mingxing Xie²  Linjun Wang³  Chenggang Xu³  Jijun Zhang³  Meng Cao³  Bin Yu⁴ 

[1] Jiangsu Key Laboratory of Micro and Nano Heat Fluid Flow Technology and Energy Application, School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, China;School of Humanity, Shanghai University of Finance and Economics, Shanghai 200433, China;School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China;State Key Laboratory of Nuclear Power Safety Monitoring Technology and Equipment, China Nuclear Power Engineering Co., Ltd., Shenzhen 518124, China;

关键词: CdZnTe;    single crystal;    thin film;    closed space sublimation;   

DOI  :  10.3390/cryst12020187

来源: DOAJ

【 摘 要 】

CdZnTe (CZT) films were grown by closed space sublimation (CSS) method on (111)-oriented CZT wafers, non-oriented CZT wafers and FTO substrates. The compositional and morphological properties of CZT films on different substrates were characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM), which indicated that CZT films grown on (111)-oriented CZT wafers had low dislocation density and high Zn composition. X-ray diffraction (XRD) measurements confirmed that CZT films grown on (111)-oriented CZT wafers had the best crystal quality. The I-V and DC photoconductivity measurements indicated that CZT films on (111)-oriented CZT wafer had good carrier transport performance. The energy spectra of CZT films grown on (111)-oriented CZT wafer presented that it had a good response to the nuclear radiation under ²⁴¹Am.

【 授权许可】

Unknown