Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy

Crystals

Shouzhi Xi¹  Boru Zhou¹  Gangqiang Zha¹  Tao Wang¹  Dou Zhao¹  Zongde Kou¹  Wanqi Jie¹  Fan Yang¹  Liying Yin¹  Ziang Yin¹ 

[1] State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China;

关键词: transmission electron microscopy (TEM);    traveling heater method;    precipitation;    interface structure;    defects in semiconductors;    CdZnTe;   

DOI  :  10.3390/cryst8010026

来源: DOAJ

【 摘 要 】

Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [1 ¯12 ]M/ / [ 0001 ]Pand ( 11 ¯1 )M/ / (1 ¯100 )P . A ledge growth interface with the preferred orientation along the [ 11 ¯1 ]Mand [ 110 ]Mwas found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

【 授权许可】

Unknown