| Nanomaterials | |
| The Effects of Hydrogen Annealing on Carbon Nanotube Field-Effect Transistors | |
| Takashi Uchino1  John L. Hutchison2  C. H. de Groot3  Peter Ashburn3  David C. Smith4  Greg N. Ayre4  | |
| [1] Department of Electrical and Electronic Engineering, Tohoku Institute of Technology, Sendai 982-8577, Japan;Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK;School of Electronics and Computer Science, University of Southampton, Southampton SO17 1BJ, UK;School of Physics and Astronomy, University of Southampton, Southampton SO17 1BJ, UK; | |
| 关键词: carbon nanotube; field-effect transistors; hydrogen annealing; electron affinity; bandgap; | |
| DOI : 10.3390/nano11102481 | |
| 来源: DOAJ | |
【 摘 要 】
We have systematically investigated the effects of hydrogen annealing on Ni- and Al-contacted carbon nanotube field-effect transistors (CNTFETs), whose work functions have not been affected by hydrogen annealing. Measured results show that the electronic properties of single-walled carbon nanotubes are modified by hydrogen adsorption. The Ni-contacted CNTFETs, which initially showed metallic behavior, changed their p-FET behavior with a high on-current over 10 µA after hydrogen annealing. The on-current of the as-made p-FETs is much improved after hydrogen annealing. The Al-contacted CNTFETs, which initially showed metallic behavior, showed unipolar p-FET behavior after hydrogen annealing. We analyzed the energy band diagrams of the CNTFETs to explain experimental results, finding that the electron affinity and the bandgap of single-walled carbon nanotubes changed after hydrogen annealing. These results are consistent with previously reported ab initio calculations.
【 授权许可】
Unknown