Analysis of Metal-Insulator Crossover in Strained SrRuO3 Thin Films by X-ray Photoelectron Spectroscopy

Coatings

卷:10

Pasquale Orgiani¹  Regina Ciancio¹  Ivana Vobornik¹  Jun Fujii¹  Giancarlo Panaccione¹  Sandeep Kumar Chaluvadi¹  Andrea Nardi¹  Chiara Bigi¹  Giorgio Rossi¹ 

[1] CNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, Italy;

关键词: metal-insulator-transition;    perovskite oxides;    laser deposition;    stress-strain relations;    angular resolved photoemission spectroscopy;    X-ray photoemission spectroscopy;   

DOI  :  10.3390/coatings10080780

来源: DOAJ

【 摘 要 】

The electronic properties of strontium ruthenate SrRuO₃ perovskite oxide thin films
are modified by epitaxial strain, as determined by growing on different substrates by pulsed
laser deposition. Temperature dependence of the transport properties indicates that tensile
strain deformation of the SrRuO₃ unit cell reduces the metallicity of the material as well as its
metal-insulator-transition (MIT) temperature. On the contrary, the shrinkage of the Ru–O–Ru
buckling angle due to compressive strain is counterweighted by the increased overlap of the
conduction Ru-4d orbitals with the O-2p ones due to the smaller interatomic distances resulting into
an increased MIT temperature, i.e., a more conducting material. In particular, in the more metallic
samples, the core level X-ray photoemission spectroscopy lineshapes show the occurrence of an
extra-peak at the lower binding energies of the main Ru-3d peak that is attributed to screening,
as observed in volume sensitive photoemission of the unstrained material.

【 授权许可】

Unknown