Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Nanophotonics

article

Nusrat Jahan¹  Hanwei Wang¹  Shensheng Zhao¹  Arkajit Dutta¹  Hsuan-Kai Huang¹  Yang Zhao¹  Yun-Sheng Chen¹ 

[1] Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign;Holonyak Micro and Nanotechnology Laboratory, University of Illinois Urbana Champaign;Beckman Institute for Advanced Science and Engineering, University of Illinois Urbana Champaign

关键词: atomic force microscopy (AFM);    chirality;    nanostructures;    optical forces;    polarization;    structured light;   

DOI  :  10.1515/nanoph-2019-0181

学科分类：社会科学、人文和艺术（综合）

来源: De Gruyter

【 摘 要 】

Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

【 授权许可】

CC BY