Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Nanophotonics

Huang Hsuan-Kai¹  Zhao Shensheng¹  Jahan Nusrat¹  Dutta Arkajit¹  Chen Yun-Sheng¹  Zhao Yang¹  Wang Hanwei¹ 

[1] Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA;

关键词: atomic force microscopy (afm);    chirality;    nanostructures;    optical forces;    polarization;    structured light;   

DOI  :  10.1515/nanoph-2019-0181

来源: DOAJ

【 摘 要 】

Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

【 授权许可】

Unknown