Optically induced forces in scanning probe microscopy

Nanophotonics

article

Dana C. Kohlgraf-Owens¹  Sergey Sukhov¹  Léo Greusard²  Yannick De Wilde²  Aristide Dogariu¹ 

[1] CREOL: The College of Optics and Photonics, University of Central Florida, 4000 Central Florida Blvd;Institut Langevin

关键词: scanning probe microscopy (SPM);    near-field scanning optical microscopy (NSOM);    scanning near-field optical microscopy (SNOM);    atomic force microscopy (AFM);    Kelvin probe force microscopy (KPFM);    near-field optics;    optical forces;    opto-mechanics;    opto-mechanical resonator;   

DOI  :  10.1515/nanoph-2013-0056

学科分类：社会科学、人文和艺术（综合）

来源: De Gruyter

【 摘 要 】

Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

【 授权许可】

CC BY