Advanced Science | |
Flexible Devices: Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters (Adv. Sci. 1/2016) | |
Shanliang Chen2  Minghui Shang2  Fengmei Gao2  Lin Wang2  Pengzhan Ying1  Weiyou Yang2  | |
[1] School of Material Science and Engineering, China University of Mining and Technology, Xuzhou City, P.R. China;Institute of Materials, Ningbo University of Technology, Ningbo City, P.R. China | |
关键词: field emitters; flexible devices; low turn‐on fields; P‐doped SiC; stable current emission; | |
DOI : 10.1002/advs.201670002 | |
来源: Wiley | |
【 摘 要 】
Novel, P-doped, flexible SiC field emitters, with both low turn-on fields and extremely high current emission stability are demonstrated by W. Y. Yang, X. S. Fang, and co-workers in article number 1500256. The high stability under high temperatures and extreme bending conditions opens up practical applications for SiC field emitters in flexible nanodevices. Abstract
【 授权许可】
CC BY-NC
© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Creative Commons Attribution-NonCommercial License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited and is not used for commercial purposes.
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