An AFM/STM multi-mode nanofabrication approach allowing in situ surface modification and characterisation

Micro & nano letters

article

Weihua Hu¹  J. Bain²  D. Ricketts³ 

[1] Department of Physics, Carnegie Mellon University;Department of Electrical and Computer Engineering, Carnegie Mellon University;Department of Electrical and Computer Engineering, North Carolina State University

关键词: atomic force microscopy;    nanofabrication;    nanostructured materials;    oxidation;    scanning tunnelling microscopy;    surface morphology;    titanium;    titanium compounds;    Ti-TiOx-Ti;    Ti–TiOx–Ti junction;    nanoscale modification;    electrical isolation;    current images;    continuous writing step;    STM modes;    AFM modes;    conductive AFM probe;    oxidised Ti;    on-the-fly switching;    surface characterisation;    surface modification;    multimode nanofabrication;    atomic force microscope-scanning tunnelling microscope;   

DOI  :  10.1049/mnl.2012.0859

学科分类：计算机科学（综合）

来源: Wiley

【 摘 要 】

Israel Institute of Technology decided to open a new elective course designed for sophomore electrical engineering students. The course was devised to expose students to the discipline of electrical engineering and improve their motivation. The core of the course was a team-based design project of a window cleaning robot. The present mixed-method study indicates a significant improvement in intrinsic motivation of the students who took the course.

【 授权许可】

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