Sensors | |
Novel Principle of Contactless Gauge Block Calibration | |
Zdeněk Buchta1  Šimon ᖎřucha2  Bᖞtislav Mikel2  Martin Čík2  Josef Lazar2  | |
[1] Institute of Scientific Instruments, Academy of Sciences of the Czech Republic, Královopolská 147, 612 64 Brno, Czech Republic; | |
关键词: low-coherence interferometry; gauge block; nanometrology; | |
DOI : 10.3390/s120303350 | |
来源: mdpi | |
【 摘 要 】
In this paper, a novel principle of contactless gauge block calibration is presented. The principle of contactless gauge block calibration combines low-coherence interferometry and laser interferometry. An experimental setup combines Dowell interferometer and Michelson interferometer to ensure a gauge block length determination with direct traceability to the primary length standard. By monitoring both gauge block sides with a digital camera gauge block 3D surface measurements are possible too. The principle presented is protected by the Czech national patent No. 302948.
【 授权许可】
CC BY
© 2012 by the authors; licensee MDPI, Basel, Switzerland
【 预 览 】
Files | Size | Format | View |
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RO202003190045430ZK.pdf | 461KB | download |