A High Speed CMOS Image Sensor with a Novel Digital Correlated Double Sampling and a Differential Difference Amplifier

Sensors

Daehyeok Kim²  Jaeyoung Bae²  Minkyu Song¹ 

[1] Department of Semiconductor Science, Dongguk University, Seoul 100-715, Korea;

关键词: CMOS image sensor;    digital correlated double sampling;    fixed pattern noise;    differential difference amplifier;   

DOI  :  10.3390/s150305081

来源: mdpi

【 摘 要 】

In order to increase the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, the fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a novel digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 µm CIS technology and it has the VGA resolution of 640 × 480. The measured conversion time is 16 µs, and a high frame rate of 131 fps is achieved at the VGA resolution.

【 授权许可】

CC BY   
© 2015 by the authors; licensee MDPI, Basel, Switzerland.