Fast and interference fringe independent optical characterization of zinc oxide nano thin films using model-based genetic algorithm for optoelectronic applications

Nanomaterials and Nanotechnology

Ebru Gungor¹  Tayyar Gungor¹  Birsen Saka¹ 

关键词: Thin films characterization;    film thickness;    genetic algorithm;    ultrasonic spray pyrolysis technique;    zinc oxide thin films;   

DOI  :  10.1177/1847980416673785

来源: InTech

【 摘 要 】

In this article, a model-based genetic algorithm is used to determine the optical properties of nanostructured zinc oxide single-sided nano thin films that does not depend on the interference fringes of optical transmission spectrum. The functional form for refractive index n(λ) and absorption coefficient α(λ) as functions of wavelength instead of randomly organized genes corresponding to the optical parameters are used in the implementation of GA. Using the proposed model for the refractive index dispersion and absorption, the transmittance curves of zinc oxide thin films obtained from optimized parameters are fitted with the original spectrum. The calculated results give us R2 values higher than 0.950. Compared to traditional optimization methods, the fitting error of genetic algorithm is typically smaller. The interference fringes are not critical to perform the genetic algorithm in comparison to the classical methods such as the envelope method. One of the advantages for this technique is its consider...

【 授权许可】

Unknown