Dielectric relaxation in glassy Se75In25−𝑥Pb𝑥 alloys

Pramana

S Kumar1¹  J Sharma¹ 

[1] Department of Physics, Christ Church College, Kanpur 208 001, India$$

关键词: Chalcogenide glasses;    dielectric measurements;    defect states.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

In this paper we report the effect of Pb incorporation in the dielectric properties of a-Se75In25 glassy alloy. The temperature and frequency dependence of the dielectric constants and the dielectric losses in glassy Se75In25−𝑥Pb𝑥 (𝑥 = 0, 5, 10 and 15) alloys in the frequency range (1 kHz–5 MHz) and temperature range (300–340 K) have been measured. A detailed analysis shows that the dielectric losses are dipolar in nature and can be understood in terms of hopping of charge carriers over a potential barrier as suggested by Elliott for the case of chalcogenide glasses. It has been found that both dielectric constant and the dielectric loss are highly dependent on frequency and temperature and also found to increase with increasing concentration of Pb in binary a-Se 75 In 25 glassy system. The results have been interpreted in terms of increase in the density of defect states by the incorporation of Pb as a metallic additive in the aforesaid glassy system.

【 授权许可】

Unknown