Defence Science Journal | |
Microscopic TV Holography for Microsystems Metrology | |
M. P. Kothiyal1  Upputuri Paul Kumar1  U. Somasundaram1  Nandigana Krishna Mohan1  | |
[1] Indian Institute of Technology Madras, Chennai | |
关键词: TV holography and Interferometry; Microsystems; Metrology; | |
DOI : | |
学科分类:社会科学、人文和艺术(综合) | |
来源: Defence Scientific Information & Documentation Centre | |
【 摘 要 】
Normal 0 false false false MicrosoftInternetExplorer4 The continuously advancing Micro-Electro-Mechanical Systems (MEMS) technology requires a robust non-contact quantitative measurement system for the characterization of their performance, reliability and integrity. A TV holographic system with long working distance microscope is developed for the static, dynamic and 3-D surface profile characterization of Microsystems. The system can be operated either incontinuousorstroboscopicillumination mode of operation. In this paper we present the development of a microscopic imaging system and its applicationsforMicrosystems Metrology. Defence Science Journal, 2011, 61(5), pp.491-498 , DOI:http://dx.doi.org/10.14429/dsj.61.908Normal 0 false false false MicrosoftInternetExplorer4
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201912010140182ZK.pdf | 954KB | download |