IEICE Electronics Express | |
An SET hardened dual-modular majority voter circuit for TMR system | |
Xiaopeng Liu1  Yan Han1  Bin Zhang1  | |
[1] Institute of Microelectronics & Photoelectronics, Zhejiang University | |
关键词: dual-modular majority voter (DMV); SET; triplemodular redundancy (TMR); radiation hardening; | |
DOI : 10.1587/elex.11.20131029 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(11)A Triple-modular redundancy (TMR) system will have a failure if Single Event Transient (SET) faults affect the voter. In this paper, we propose a full SET-tolerance dual-modular majority voter (DMV) circuit for all internal nodes. The DMV consisting of two simplex-modular voters, two inverters, a C-element inverter and a weak keeper is implemented in CMOS 40nm technology. A novel XOR gate and a multiplexer based voter is also presented and used as a simplex-modular voter so that the whole DMV can be implemented by 40 CMOS transistors. A novel C-element weak keeper is also proposed to reduce power consumption. Monte-Carlo simulation results show that power consumption of DMV only increases by 11.09% compared to that of a single traditional voter.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300846407ZK.pdf | 929KB | download |