IEICE Electronics Express | |
A study on the self turn-on phenomenon of power MOSFET induced by the turn-off operation of body diodes | |
Tsuyoshi Funaki1  | |
[1] Osaka University, Div. of Electrical, Electronic and Information Eng. Graduate School of Engineering | |
关键词: self turn-on; gate voltage fluctuation; power MOSFET; body diode; | |
DOI : 10.1587/elex.11.20140350 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(7)Cited-By(1)SiC power devices generally operate with fast switching. The fast switching operation in power conversion circuits suffer from the self turn-on phenomenon of a power MOSFET in which the gate voltage is induced to fluctuate by the turn-on operation of the MOSFET on the other side in the bridge circuit. The self turn-on results in a large power loss, when the fluctuating gate voltage exceeds the threshold gate voltage. This paper analytically discusses the self turn-on phenomenon of the MOSFET related to the turn-off operation of its body diode, which is initiated by the turn-on operation of the MOSFET on the other side in the bridge. This analysis was evaluated experimentally.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300289261ZK.pdf | 834KB | download |