Fabrication and Characterization of Alq3 Thin Films

Ingeniería y Ciencia

Adames, R. P¹  Gómez, D.P¹  Segura, J. A¹  Ardila, A. M¹ 

[1] Universidad Nacional de Colombia, Bogotá, Colombia

关键词: thin film;    thermal evaporation;    substrate;    characterization;    organic semiconductor;   

DOI  :  

学科分类：工程和技术（综合）

来源: Universidad E A F I T

【 摘 要 】

Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. The thin films were characterized by SEM microscopy and perfilometry to compare the obtained thickness in-situ by quartz crystals; furthermore photoluminescence measures were made.

【 授权许可】

Unknown