Flexible block management with data migration wear-leveling algorithm for phase change memory

IEICE Electronics Express

Mi Zhou¹  Yuchan Wang¹  Yifeng Chen¹  Yueqing Wang¹  Xiaogang Chen¹  Gezi Li¹  Shunfen Li¹  Zhitang Song¹ 

[1] State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences

关键词: phase change memory;    wear-leveling;    endurance;    block management;   

DOI  :  10.1587/elex.11.20140924

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(20)Phase change memory (PCM) is regarded as a powerful competitor for future non-volatile memory applications. However, a key drawback is its limited write endurance. This paper proposes a flexible block management method with data migration wear-leveling algorithm (FBDM). The proposed method divides blocks into two halves meanwhile blocks can be split and merged flexibly. Data migration wear-leveling algorithm has been presented to extend the life of PCM. We simulated our method using different traces and compare it with previous methods. Simulation results show that the proposed method outperforms comparison methods in terms of wear evenness and overhead reduction.

【 授权许可】

Unknown