Perovskite La1-xSrxFeO3 Thin Films Deposited by Laser Ablation Process

Archives of Metallurgy and Materials

Ł. Cieniek¹  A. Cyza¹  A. Kopia¹ 

[1] AGH-UNIVERSITY OF SCIENCE AND TECHNOLOGY, AL. A. MICKIEWICZA 30, 30-059 KRAKOW, POLAND

关键词: Keywords : Perovskite LaFeO3;    thin films;    gas sensors;    PLD;   

DOI  :  10.1515/amm-2016-0179

学科分类：金属与冶金

来源: Akademia Gorniczo-Hutnicza im. Stanislawa Staszica / University of Mining and Metallurgy

【 摘 要 】

The aim of the research was to investigate the influence of strontium on the structure of thin films La1-xSrxFeO3 (x = 0; 0,1; 0,2). The LaFeO3 and Sr-doped LaFeO3 films were produced by pulsed laser deposition (PLD) on Si (100) substrate using the Nd-YAG (λ = 266 nm) laser. SEM, AFM and XRD methods were used to characterize the structure and morphology of the thin films. X-Ray Diffraction analysis showed only the LaFeO3 phase in the undoped thin film and the La0.9Sr0.1O3 and La0.8Sr0.2O3 phases in thin films doped by Sr. The mean crystallite size, calculated by Williamson-Hall method, was smaller (of the order of 18 nm) in films doped by Sr. SEM analysis showed small droplets in thin films doped by Sr. Highly developed surface layer was observed using the AFM microscope for thin films doped by Sr.

【 授权许可】

Unknown