Bulletin of Materials Science | |
Effect of nitrogen flow ratio on structure and properties of zirconium nitride films on Si(100) prepared by ion beam sputtering | |
关键词: Zirconium nitride; ion beam sputtering; reactive; flow ratio.; | |
学科分类:材料工程 | |
来源: Indian Academy of Sciences | |
【 摘 要 】
In this study, zirconium nitride thin films were deposited on Si substrates by ion beam sputtering (IBS). Influence of N2/(N2+Ar) on the structural and physical properties of the films has been investigated with respect to the atomic ratio between nitrogen and zirconium. It was found that the thickness of layers decreased by increasing the F(N2). Moreover, crystalline plane peaks such as (111), (200) and (220) with (111) preferred orientation were observed due to strain energy which associate with (111) orientation in ZrN. Also, the fluctuation in nitrogen flow ratio results in colour and electrical resistivity of films.
【 授权许可】
CC BY
【 预 览 】
Files | Size | Format | View |
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RO201902184389950ZK.pdf | 220KB | download |