Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage

IUCrJ

Rack, A.¹  Danilewsky, A.N.²  Scheel, M.³ 

[1] European Synchrotron Radiation Facility, Grenoble, France;Kristallographie, Institut für Geo- und Umweltnaturwissenschaften, Albert-Ludwigs Universität Freiburg, Germany;Synchrotron Soleil, Gif sur Yvette, France

关键词: MATERIALS SCIENCE;    X-RAY DIFFRACTION IMAGING;    PHASE-CONTRAST X-RAY IMAGING;    TIME-RESOLVED STUDIES;   

DOI  :  10.1107/S205225251502271X

学科分类：数学（综合）

来源: International Union of Crystallography

【 授权许可】

CC BY