Experiment and prediction on thermal conductivity of Al2O3/ZnO nano thin film interface structure

Bulletin of Materials Science

关键词: Al2O3/ZnO nano thin film;    thermal conductivity (TC);    nanoscale;    interface structure.;   

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

We predict that there is a critical value of Al2O3/ZnO nano thin interface thickness based on two assumptions according to an interesting phenomenon, which the thermal conductivity (TC) trend of Al2O3/ZnO nano thin interface is consistent with that of relevant single nano thin interface when the nano thin interface thickness is > 300 nm; however, TC of Al2O3/ZnO nano thin interface is higher than that of relevant single nano thin interface when the thin films thickness is < 10 nm. This prediction may build a basis for the understanding of interface between two different oxide materials. It implies an idea for new generation of semiconductor devices manufacturing.

【 授权许可】

CC BY