期刊论文详细信息
Active and Passive Electronic Components
Analysis of Temperature and Drain Voltage Dependence of Substrate Current in Deep SubmicrometerMOSFET'S
R. Rmaily1  K. Raïs1  A. El Abbassi1  Y. Amhouche1 
[1] Laboratoire de Caractéisation des Composants à Semi-conducteurs, Université Chouaib Doukkali, B.P. 20, EL Jadida, Morocco, ucd.ac.ma
关键词: Channel length;    Temperature;    Substrate current;    Impact ionization;    Submicrometer MOSFET's;   
Others  :  1369702
DOI  :  10.1155/2001/65128
 received in 2001-04-01, accepted in 2001-05-15,  发布年份 2001
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Copyright © 2001 Hindawi Publishing Corporation 2001

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