期刊论文详细信息
| Active and Passive Electronic Components | |
| Impact of the Stress on the Sub-Micron N-Metal Oxide Semiconductor Field Effect Transistor Characteristics | |
| A. Bouhdada1 R. Marrakh1 | |
| [1] Laboratoire de Physique des Matériaux et de Microélectronique, Université Hassan II Aïn Chok Faculté des Sciences, Kin8, Route d'El Jadida, BP 5366 Maârif, Casablanca, Morocco, univcasa.ma | |
| 关键词: MOSFET; Transconductance; Drain current; Stress time; Hot-carrier-injection; | |
| Others : 1369690 DOI : 10.1155/2001/18731 |
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| received in 2001-04-15, accepted in 2001-05-15, 发布年份 2001 | |
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【 授权许可】
Copyright © 2001 Hindawi Publishing Corporation 2001
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| 018731.pdf | 635KB |  download |
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