期刊论文详细信息
| Active and Passive Electronic Components | |
| Impact of the Stress on the Sub-Micron N-Metal Oxide Semiconductor Field Effect Transistor Characteristics | |
| R. Marrakh1 A. Bouhdada1 | |
| [1] Laboratoire de Physique des Matériaux et de Microélectronique, Université Hassan II Aïn Chok Faculté des Sciences, Kin8, Route d'El Jadida, BP 5366 Maârif, Casablanca, Morocco; | |
| 关键词: Hot-carrier-injection; Stress time; Drain current; Transconductance; MOSFET.; | |
| DOI : 10.1155/2001/18731 | |
| 来源: DOAJ | |
【 授权许可】
Unknown
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