Determination of dislocation density in an Inconel 600 nickel alloy by XLPA and automated EBSD

11th Hungarian Conference on Materials Science

Berecz, T.^1 ; Jóni, B.^2 ; Ginsztler, J.^1

Department of Materials Science and Technology, Budapest University of Technology and Economics, Budapest, Hungary^1

Loránd Eötvös University, Department of Materials Physics, Budapest, Hungary^2

关键词: Automated electron backscatter diffraction;    Crystalline structure;    Crystallographic defects;    Dislocation densities;    Examination methods;    Geometrically necessary dislocations;    Misorientations;    X ray diffraction line profile analysis;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/426/1/012004/pdf
DOI  :  10.1088/1757-899X/426/1/012004

来源: IOP

【 摘 要 】

There are two widely used examination methods to study microstructure of polycrystalline materials, namely the automated electron backscatter diffraction (EBSD) and the X-ray diffraction line profile analysis (XLPA). Both methods are suitable to determine quality and quantity of crystallographic defects or irregularities within crystalline structures. However, the EBSD method can be used to estimate the density of only geometrically necessary dislocations (GND), while the XLPA method can give the total dislocation density. A novel software was developed for the determination of GND density from misorientations measured between the neighbouring pixels in EBSD images. Therefore EBSD method is a local, while XLPA method is a non-local procedure to determine dislocation densities. In fact, the calculated GND density depends on the applied step size of EBSD measurements, namely GND densities increase with decreasing the step size. So this leads to a question of how large applied step size of EBSD measurements gives a good approximation for the real GND density in a given polycrystalline material.