Development the Fourier analysis method of x-ray diffraction to calculate variables in crystal structure as well as calculation of some lattice parameters

2nd International Scientific Conference (Pure Sciences, Brilliant Creativity and Renewed Building)

Jahil, Sarab Saadi^1 ; Harbbi, Khalid Hellal^1

Department of Physics, College of Education, University of Baghdad, Ibn Al-Haitham, Iraq^1

关键词: Crystalline structure;    Dislocation densities;    Energy density;    Fourier analysis methods;    Fourier methods;    Mean square strain;    Micro-strain;    Texture coefficient;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/571/1/012112/pdf
DOI  :  10.1088/1757-899X/571/1/012112

来源: IOP

【 摘 要 】

The Fourier method was developed to calculate other important variables in the crystalline structure, such a strain, which is equal to 7.4828 x 10-3 instead of the mean square strain and the energy density of the strain, which is equal to 2799614.7 dyne/cm2 and the stress equal to 7.4828 x 108 dyne/cm2. The results obtained from the Fourier method for calculating other parameters of the manganese oxide lattice for each peak of X-ray diffraction peaks such as the texture coefficient, its mean value equal to 0.99999 and the micro strains, which its mean value equal to 4.47 × 10-3 dislocation density, its mean value are equal to 37.3 (lines .m-2) and the specific surface area its mean value is equal to 19,58432 of crystalline volume. A comparison was also made between the values of the square of strain and the apparent strain.