Endurance Test on Carbon Film Fixed Resistor under Escalated Voltage Stress

4th International Conference on Applied Materials and Manufacturing Technology

材料科学;机械制造

Fuqing, Yuan^1 ; Lu, Jinmei^1

Department of Engineering and Safety, University of Tromsø, 9037, Norway^1

关键词: Electronic device;    Endurance test;    Individual Differences;    Life modeling;    Lower stress;    Reliability and robustness;    Resistance shifts;    Voltage stress;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/423/1/012117/pdf
DOI  :  10.1088/1757-899X/423/1/012117

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Film fixed resistor is a basic unit in the electronic devices. As it is less frequently failed than other units such as capacitor, the reliability and robustness of it are less concerned both in the academics and in the industries. This paper investigates the endurance of the carbon film fixed resistor. The resistance shift and life of it under the escalated voltage stress level are the aim. A PCB board is designed to test the performance under various voltage stress levels. It was observed at lower stress level, the resistance can maintain the resistance in certain level, and can function even they burned. However, at high stress level, the resistor will also burn but the resistance will be extremely high to reach unacceptable level. The individual difference is obvious due to material dissimilarities. Resultantly, the life of the resistor is far deterministic but uncertain. A life model is developed in this paper to capture the uncertainty.