Analysis of SET pulses propagation probabilities in sequential circuits

2017 2nd International Conference on Reliability Engineering

Cai, Shuo^1,2 ; Yu, Fei^1,2 ; Yang, Yiqun^1,2

School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha

410114, China^1

Hunan Provincial Key Laboratory of Intelligent Processing of Big Data on Transportation, Changsha University of Science and Technology, Changsha

410114, China^2

关键词: CMOS transistors;    Feature sizes;    New approaches;    Propagation probabilities;    Single event transients;    Union operations;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/351/1/012010/pdf
DOI  :  10.1088/1757-899X/351/1/012010

来源: IOP

【 摘 要 】

As the feature size of CMOS transistors scales down, single event transient (SET) has been an important consideration in designing logic circuits. Many researches have been done in analyzing the impact of SET. However, it is difficult to consider numerous factors. We present a new approach for analyzing the SET pulses propagation probabilities (SPPs). It considers all masking effects and uses SET pulses propagation probabilities matrices (SPPMs) to represent the SPPs in current cycle. Based on the matrix union operations, the SPPs in consecutive cycles can be calculated. Experimental results show that our approach is practicable and efficient.