Modified SPC for short run test and measurement process in multi-stations

3rd International Conference on Mechanical, Manufacturing and Process Plant Engineering

机械制造;工业技术

Koh, C.K.^1 ; Chin, J.F.^1 ; Kamaruddin, S.^2

School of Mechanical Engineering, Universiti Sains Malaysia, Nibong Tebal, Pulau Pinang

14300, Malaysia^1

Department of Mechanical Engineering, Universiti Teknologi PETRONAS, Seri Iskandar, Perak

32610, Malaysia^2

关键词: Acceptance limits;    Electronic test;    Industry practices;    Measurement uncertainty;    Observed values;    Quality monitoring;    Short production runs;    Statistical process controls (SPC);   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/328/1/012009/pdf
DOI  :  10.1088/1757-899X/328/1/012009

学科分类：工业工程学

来源: IOP

【 摘 要 】

Due to short production runs and measurement error inherent in electronic test and measurement (T and M) processes, continuous quality monitoring through real-time statistical process control (SPC) is challenging. Industry practice allows the installation of guard band using measurement uncertainty to reduce the width of acceptance limit, as an indirect way to compensate the measurement errors. This paper presents a new SPC model combining modified guard band and control charts (Z chart and W chart) for short runs in T and M process in multi-stations. The proposed model standardizes the observed value with measurement target (T) and rationed measurement uncertainty (U). S-factor (Sf) is introduced to the control limits to improve the sensitivity in detecting small shifts. The model was embedded in automated quality control system and verified with a case study in real industry.