Trace element analysis by EPMA in geosciences: detection limit, precision and accuracy

15th European Workshop on Modern Developments and Applications in Microbeam Analysis; 7th Meeting of the International union of Microbeam Analysis Societies

材料科学;物理学

Batanova, V.G.^1,2 ; Sobolev, A.V.^1,2,3 ; Magnin, V.^1

University Grenoble Alpes, ISTerre, CNRS, IRD, IFSTTAR, Grenoble

38000, France^1

Vernadsky Institute of Geochemistry and Analytical Chemistry, ul. Kosygin 19, Moscow

119991, Russia^2

Institut Universitaire de France, 1 rue Descartes, Paris Cedex 05

75231, France^3

关键词: Accelerating voltages;    Crystal monochromators;    Electron probe microanalyser;    Experimental petrology;    Laser ablation inductively coupled plasma mass spectrometries (LA ICP MS);    Minor and trace elements;    Secondary fluorescence;    Trace element analysis;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/304/1/012001/pdf
DOI  :  10.1088/1757-899X/304/1/012001

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Use of the electron probe microanalyser (EPMA) for trace element analysis has increased over the last decade, mainly because of improved stability of spectrometers and the electron column when operated at high probe current; development of new large-area crystal monochromators and ultra-high count rate spectrometers; full integration of energy-dispersive / wavelength-dispersive X-ray spectrometry (EDS/WDS) signals; and the development of powerful software packages. For phases that are stable under a dense electron beam, the detection limit and precision can be decreased to the ppm level by using high acceleration voltage and beam current combined with long counting time. Data on 10 elements (Na, Al, P, Ca, Ti, Cr, Mn, Co, Ni, Zn) in olivine obtained on a JEOL JXA-8230 microprobe with tungsten filament show that the detection limit decreases proportionally to the square root of counting time and probe current. For all elements equal or heavier than phosphorus (Z = 15), the detection limit decreases with increasing accelerating voltage. The analytical precision for minor and trace elements analysed in olivine at 25 kV accelerating voltage and 900 nA beam current is 4 - 18 ppm (2 standard deviations of repeated measurements of the olivine reference sample) and is similar to the detection limit of corresponding elements. To analyse trace elements accurately requires careful estimation of background, and consideration of sample damage under the beam and secondary fluorescence from phase boundaries. The development and use of matrix reference samples with well-characterised trace elements of interest is important for monitoring and improving of the accuracy. An evaluation of the accuracy of trace element analyses in olivine has been made by comparing EPMA data for new reference samples with data obtained by different in-situ and bulk analytical methods in six different laboratories worldwide. For all elements, the measured concentrations in the olivine reference sample were found to be identical (within internal precision) to reference values, suggesting that achieved precision and accuracy are similar. The spatial resolution of EPMA in a silicate matrix, even at very extreme conditions (accelerating voltage 25 kV), does not exceed 7 - 8 μm and thus is still better than laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) or secondary ion mass spectrometry (SIMS) of similar precision. These make the electron microprobe an indispensable method with applications in experimental petrology, geochemistry and cosmochemistry.